5th June - Nottingham
Manufacturing Metrology Guest Seminar - Peter de Groot
We are delighted to welcome Peter de Groot to the Maufacturing Metrology Department. This event is free to attend.
Dr. Peter de Groot is fascinated by optics and its practical use for measuring things. Educated first in History then in experimental atomic Physics at the Universities of Utah, Grenoble, Maine, and Connecticut, he enjoys discovering the hidden links between academic and applied research that fuel inventions and creative solutions in science and industry.
After learning practical optics for metrology applications at Perkin-Elmer corporation and Boeing corporation, Peter joined Zygo in 1992, and has been Executive Director of Research, Chief Scientist, and now Scientist Emeritus. His work has led to 141 US patents for optical instruments and 225 technical papers and book chapters.
He is a Fellow of SPIE, Optica, the International Academy of Engineering and Technology, and the Institute of Physics (UK). He is the 2024 President Elect of SPIE, the international society for optics and photonics.
An experienced educator, Peter has taught secondary school science in West Africa, advanced topics at universities and technical institutes, and professional development courses worldwide. Peter has been since 2017 an Honorary Professor at the University of Nottingham, participating in collaborative projects to advance the state of the art in optics for manufacturing metrology.
Agenda
09:30-10:45 Fourier Optics: Imaging (Peter de Groot)
10:45-11:00 Refreshments
11:00-12:15 Fourier Optics: Surface Topography (Peter de Groot)
12:15-13:15 Lunch
13:15-14:15 Adventures in Optical Metrology (Peter de Groot)
14:15-14:30 Refreshments
14:30-16:00 Manufacturing Metrology Research Presentations
Abstracts
Fourier Optics Seminar (09:30-12:15)
When we first learn about optics, we are happy to draw straight lines on paper showing the basic principles of lenses and mirrors. Soon we master the foundations of imaging and geometrical optics and collect a toolbox of telescopes, microscopes, and optical instrument designs.
For those of us that are often most interested in inventing and using new metrology instruments, “wave optics” can then feel like a beautiful yet mysterious realm of advanced mathematics, rather than a practical tool. The solution to all this is Fourier optics—an amazingly powerful and practical approach to solving physical optics problems. With a bit of experience, it can even become as intuitive and familiar as tracing lines to show how lenses works.
In these brief lectures, I review the origins, basics concepts, and everyday use of Fourier optics for practical applications. The first lecture will be on imaging systems, while the second extends these ideas to the optical measurements of surface topography, including interferometry. The lectures provide a starting point for those new to Fourier optics, as well as novel perspectives for experts.
Adventures in Optical Metrology (13:15-14:15)
Optical dimensional metrology refers to a wide range of instruments and techniques for measuring size, shape, position, and surface structure. After 40 years’ experience, I have quite a few stories to tell about measurement problems and their solutions. In this lecture, I will summarize a few selected topics, each starting with a problem statement, followed by the technical solution, and the eventual outcome of the project. Examples will include some great success stories as well as some not-so-great outcomes, particularly when factoring in the measure of commercial success that these solutions may or may not have enjoyed. During this journey, I hope to communicate the richness of optical metrology both for basic knowledge of the world around us and as an important part of manufacturing and applied science.
For those of us that are often most interested in inventing and using new metrology instruments, “wave optics” can then feel like a beautiful yet mysterious realm of advanced mathematics, rather than a practical tool. The solution to all this is Fourier optics—an amazingly powerful and practical approach to solving physical optics problems. With a bit of experience, it can even become as intuitive and familiar as tracing lines to show how lenses works.
In these brief lectures, I review the origins, basics concepts, and everyday use of Fourier optics for practical applications. The first lecture will be on imaging systems, while the second extends these ideas to the optical measurements of surface topography, including interferometry. The lectures provide a starting point for those new to Fourier optics, as well as novel perspectives for experts.
Manufacturing Metrology Research Presentations (14:30-16:00)
A series of presentations about current research occurring with Manufacturing Metrology Team.